A method of manufacturing semiconductor device in the method of manufacturing wafer level semiconductor device that can search the defective products from the marking information even when sealing resin is formed on the wafer and a semiconductor device manufactured with the same method. A method of manufacturing...http://www.google.com.tw/patents/US6777250?utm_source=gb-gplus-share專利 US6777250 - Manufacture of wafer level semiconductor device with quality markings on the sealing resin
