Apparatus for scanning an integrated circuit chip or other device under test (DUT) for defects and for visual alignment of chip electrical leads with leads of an electrical tester for testing the chip circuit(s). The apparatus provides an image forming system to provide a visually perceptible image of...http://www.google.com.tw/patents/US5481202?utm_source=gb-gplus-share專利 US5481202 - Optical scan and alignment of devices under test
