The invention provides methods for enhancing circuit reliability under statistical process variation. For highly replicated circuits such as SRAMs and flip flops, a rare statistical event for one circuit may induce a not-so-rare system failure. To combat this, the invention discloses the method called...http://www.google.com.tw/patents/US8155938?utm_source=gb-gplus-share專利 US8155938 - Method and apparatus for sampling and predicting rare events in complex electronic devices, circuits and systems
