A method for inspecting an object using a structured light measurement system that includes a light source and an imaging sensor. The method includes emitting light from the light source, polarizing each of a plurality of different wavelengths of the light emitted from the light source at different polarization...http://www.google.com.tw/patents/US7285767?utm_source=gb-gplus-share專利 US7285767 - Methods and apparatus for inspecting an object
