A probe tip configuration, being part of a probe (FIG. 2) for use in a scanning proximity microscope, is disclosed, comprising a cantilever beam (1) and a probe tip. Said tip comprises a first portion of a tip (2) and at least one second portion of a tip (5). Said first portion of a tip is connected...http://www.google.com.tw/patents/US6328902?utm_source=gb-gplus-share專利 US6328902 - Probe tip configuration and a method of fabrication thereof
